Tuesday, 7 February 2006 - 11:30 AM

This presentation is part of: Crops--Peanuts and Soybeans

X-ray Based Soybean Root Visualization and Characterization.

Fred Allen1, Dan McDonald2, Richard Johnson1, and Ronald Michaels2. (1) University of Tennessee, Department of Plant Sciences, 2431 Joe Johnson Drive, Knoxville, TN 37996-4561, (2) Phenotype Screening Corporation, 10233 Chapman Highway, Seymour, TN 37865

Roots are a vitally important plant characteristic but they are difficult to study and evaluate in soil or even in artificial media. The objective of this research was to determine if an x-ray based system could be used to rapidly and accurately evaluate and classify soybean (Glycine max) roots. We chose a normal rooting variety, 'USG 5601T' and a prolific rooting accession, PI416.937 to utilize in the study. Ten seedlings of each variety were transplanted into artificial substrate containers and imaged with a digital x-ray radiography system at transplanting and at 7 d intervals through day 21. The x-ray images were analyzed manually to determine if individual plants could be classified into variety-type classes of root architecture. At 14 d post-transplant, the individual plants could be placed into USG 5601T or PI clusters with approximately 80% accuracy. This was based on taproot length and lateral root density values. Additional data will be presented from plants grown in larger substrate containers and imaged weekly up to 42 d.

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