Dry bean is the most important grain legume for direct human consumption worldwide. White mold, a foliar disease caused by the fungal pathogen Sclerotinia sclerotiorum (Lib.) de Bary, often reduces crop yield. The long term goal of this research is to combine quantitative trait loci (QTL) that confer resistance to white mold from common bean (Phaseolus vulgaris L.) with QTL from scarlet runner bean (P. coccineus L.) using molecular markers. QTL previously identified in common bean line G122 and scarlet runner bean accession PI 255956 were combined into an inbred backcross line (IBL) population. Evaluation of the BC1F5 IBL demonstrated white mold resistance ranging from three to seven (1=resistant, 9=susceptible) using the straw test. Analyses of molecular markers linked to QTL showed segregation distortion with preferred transmission of P. vulgaris alleles. Resistant IBL that pyramid resistance sources from both species should provide dry bean breeders novel genes for resistance to white mold.