Wednesday, November 7, 2007
279-9

Resistance to Tan Spot in a Synthetic Wheat Collection Based on Percent Leaf Infection.

Jana Morris1, Brett Carver2, Robert Hunger1, Arthur R. Klatt3, and Wayne Whitmore1. (1) Oklahoma State University, 8509 W Kelly Sue dr., Stillwater, OK 74074, (2) Plant & Soil Science, Oklahoma State University, Oklahoma State University, 368 North Ag Hall, Stillwater, OK 74078-6028, (3) 368 Ag Hall, Oklahoma State University, Oklahoma State University, Dept. of Plant & Soil Sciences, Stillwater, OK 74078

Tan spot caused by the fungal organism Pyrenophora tritici-repentis is an important foliar disease of wheat (Triticum aestivum L.) throughout the world. Tan spot becomes more noticeable in minimum tillage farming systems due to survival from one season to the next on remnant wheat stubble from harvest. In this study, 97 synthetic hexaploid wheat accessions developed at the International Maize and Wheat Improvement Center (CIMMYT) were evaluated for seedling resistance to Tan spot in a greenhouse. The seedlings were inoculated with a chlorosis and necrosis producing isolate collected from Oklahoma. Each plant was evaluated at the 3 to 5 leaf stage one week post-inoculation. Evaluation consisted of the mean percent leaf infection on a scale of 1 to 10 for three leaves and two plants measured in one replication. This was repeated for five replications. Several accessions consistently showed high resistance when compared to the resistant check, ‘Red Chief'. These results show that synthetic hexaploid wheat may be a new source of resistance to Tan spot.